Data-Driven Lot Sizing with Random Yield
3 Mar 2025
13:00 -14:15
Times are shown in local time.
Open to: All
Room W2.01 (Cambridge Judge Business School)
Trumpington St
Cambridge
CB2 1AG
United Kingdom
Join our Operations and Technology Management seminar
Speaker: Professor Fikri Karaesmen, Koç University
About the seminar topic
Motivated by yield uncertainty in semiconductor manufacturing, we explore a data-driven lot sizing problem under random yield. Our focus is on the case where the random yield rate of the process depends on a number of features that can be observed before the lot sizing decision is made. We develop and compare the performance of different estimation and optimisation approaches for this problem.
We calibrate and test the methods on a publicly available data set for feature-dependent semiconductor yield data which presents challenges that are typical in prescriptive analytics in operations: a large number of features and relatively few observations.
Speaker bio
Fikri Karaesmen is a Professor of Industrial Engineering at Koç University currently visiting Imperial College. He received his BS degree from METU (Ankara, Turkey) and MS and PhD degrees from Northeastern University (Boston, MA, US).
His main research interests are in stochastic modelling with applications to production, inventory and service systems.
Please note, a light lunch will be served from 12:15 – 13:00.
Register
No registration required. If you have any questions about this seminar, please email Khanti Tsui.